RnoINT0088575 @ rn6
Intron Retention
Gene
ENSRNOG00000016584 | Mamdc4
Description
MAM domain containing 4 [Source:RGD Symbol;Acc:708583]
Coordinates
chr3:2791086-2791763:-
Coord C1 exon
chr3:2791590-2791763
Coord A exon
chr3:2791171-2791589
Coord C2 exon
chr3:2791086-2791170
Length
419 bp
Sequences
Splice sites
5' ss Seq
CGGGTGAGG
5' ss Score
8.48
3' ss Seq
CTAACCCTCCCTGCCCTCAGATC
3' ss Score
11.06
Exon sequences
Seq C1 exon
TTCACCTTCTATTACTACCTGCATGGGTCTGAGGCCAACCAATTCCAGCTCTTTGTGCAGGCACAGGGGCTCAACACCACCCAGCCTCCTGTCCTACTCCGAAGCCGCCATGGAGAGTTGGGGACAGCCTGGGTCAGAGACCGGGTTAACATTCAAAGTGCCCATCCATTTCGG
Seq A exon
GTGAGGCTGGGCTAGAGGGCAGAATCCAGGGAATCCTGCCTAGAGCACGCACAGGAGTACTCTGGGATTCTTTTTTTTTTTTAAAGATTTATTTATTTATTATATATAAGTACACTGTAGCTGTCTTCAGACACATGAGAAGAGGGCATCAGATCTCATTACGGATGGTTGTAAGCCACCATGTGGTTGCTGGGAATTGAACTCAGGACCTCTGGAAGAGCAGTCAGTGCTCTTAACCACTGAGCCATTCCTCCAGCCCGTACTCTGGGATTCTTTAGTCATTCCTGAAGACTGCTCAGTGGGAAAGCTTGAGAGTGTTGGGAAATTCATGAAGTCTAACAATATAGGGATGGGAAGGGTGCCAGAGGAAAGACAGGACAGAACAGTGCTTGGCATTCCCTAACCCTCCCTGCCCTCAG
Seq C2 exon
ATCCTTCTTGCTGGGGAGACTGGTCCAGGAGGCTTCGTGGGCCTAGACGACCTTATCATGTCCAACCACTGCATACTTGTTCCAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000016584:ENSRNOT00000022390:10
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0062918=MAM=FE(36.8=100)
A:
NA
C2:
PF0062918=MAM=PD(16.1=86.2)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Conservation
Human
(hg38)
No conservation detected
Mouse
(mm10)
No conservation detected
Chicken
(galGal3)
No conservation detected
Zebrafish
(danRer10)
No conservation detected
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
ACCTTCTATTACTACCTGCATGGGT
R:
GGAACAAGTATGCAGTGGTTGGA
Band lengths:
254-673
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]