GgaINT0007390 @ galGal4
Intron Retention
Gene
ENSGALG00000003194 | ATP6V0A2
Description
V-type proton ATPase 116 kDa subunit a isoform 2 [Source:RefSeq peptide;Acc:NP_990054]
Coordinates
chr15:4912936-4913715:-
Coord C1 exon
chr15:4913597-4913715
Coord A exon
chr15:4913147-4913596
Coord C2 exon
chr15:4912936-4913146
Length
450 bp
Sequences
Splice sites
5' ss Seq
CTTGTAAGT
5' ss Score
8
3' ss Seq
TTTTCTTCATTATCTTTTAGACA
3' ss Score
9.51
Exon sequences
Seq C1 exon
ATTTGGAACTTGGCAAGCAACCGTCTCAGTTTTTTAAATTCTTTCAAGATGAAAATGTCTGTGATTCTTGGAGTGGCTCACATGACATTTGGAGTTGTATTAGGAGTATTTAACCACTT
Seq A exon
GTAAGTACAAGAAGTTATGGTAACATTATGTTTTTTACCAAGTCTGTAATTATAACAGTTAACCTGGCAAGAGAAATGGGGATGGATGTGTGTGTTTTGTTTTCTTCAACAAAACCCAGCATAATAGTAATTGTCTTAAAAAAAAAAAAAAAGAAAAAAAAAAAGAAAACAAAACAGCAGTAACAGAGGTTGTCTTTCACAGAAATTAGATAATGGGCCAGTATGATGCCAAAAAGTATTTCACTGCTAAGTGGAAGTACATGCTTCACATGGTATTGATTTCCAGTAAAATACCAGGTTAAAATGTCACTGAGTATGAAGAAATCACTTTCAGGTCCTGAATTCAGTACTGCTCTTTAAAATGACGTTGTGACCATGTTTGGGTCCCAAGTTTACCTTGATCTTACTTTGTAAAACTTACTTATCCCTTTTTTCTTCATTATCTTTTAG
Seq C2 exon
ACATTTCAAGAAGAAGTACAATATTTATTTGGTTTTTCTTCCTGAACTTTTGTTCATGATGAGCATCTTCGGCTACCTTGTGTTCATGATTTTCTTTAAGTGGTTAGCATACTCTGCAGAGGACTCCACAACTGCTCCAAGCATTCTGATTCAGTTTATTAACATGTTCCTGTTTCCTGGTGGTGAAGCAGATGCCTTTTATACTGGACAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000003194:ENSGALT00000005063:14
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0149614=V_ATPase_I=FE(4.9=100)
A:
NA
C2:
PF0149614=V_ATPase_I=FE(8.7=100)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
TTTGGAACTTGGCAAGCAACC
R:
TGTCCAGTATAAAAGGCATCTGCT
Band lengths:
328-778
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]