GgaINT0145315 @ galGal3
Intron Retention
Gene
ENSGALG00000000406 | F1NRZ0_CHICK
Description
NA
Coordinates
chr28:524637-525489:+
Coord C1 exon
chr28:524637-524687
Coord A exon
chr28:524688-525396
Coord C2 exon
chr28:525397-525489
Length
709 bp
Sequences
Splice sites
5' ss Seq
CAGGTGAGC
5' ss Score
9.6
3' ss Seq
GCCATTTCCTTGTATCACAGCCT
3' ss Score
5.96
Exon sequences
Seq C1 exon
AAGCCGTGGGTTTGGGATCACACTGTGTGCTGGCTGAGATATCCACAACAG
Seq A exon
GTGAGCTGCAAGTCTGGGATAACTCAGGTTGGAAGGAGGTTTCTTGTCAGCTGTGAGCTCAGAGCAGGCTGCTCAGGTCTTTCTCCAGTCTGGTTTTGAAGACCTTAAGGGATGGAAACTGCACAACGTCCCCAGGCAACCTGTCCTGCTATTTGACAACTGTCATGAGTCCAAAGTTGCCCCTTAGATCCACCTCTTGTTTCTAACCATGCACGCTGCCTCTCACCCTCCCACCATGAACCACAGTGAAAACTTGGCTGTCTTCCTGACCAGCTCCCTGCAGGCCGTGCGTGTGGAGGAGCAGCAGGAGGCTGTCCTGCCTCTGCCCTGAGCAGCCACCTCTTCTCATTGAGTTTCTCTGTAATACAAGCCTGGCTAGAAGGAGCTCCACCTGTGGGGCCACAAAAGGGACCAGGCAGTCAAGACACCCCTTGAATTCTTGAAGAGCAATGGGGACAGAACGTCCAACAGGAGATCCTGGCTCCCCTCAGTTTCTCTGGAATGATGTGGCACTTGTCCTGCCCTCAGTGCAGCCACCAGCACAGCAGCAAACAGTTCAGCCACAGGGGATGGGGAATCATAGATGTGACCAAGCCCTGCTGTCCCAAATGCAGTCTGAATGAGTGCACTTACTTGGGAAGAGCCTTGTCCTTTCCTGTCCCCCAAGGCTAAGCAAGGGTTGTCACGTTGCCATTTCCTTGTATCACAG
Seq C2 exon
CCTCTCCTGCCCGCACTGGGCTGGTTCTACCTGCTGGAGCTCTCCTTCTACTGCTCACTGGTTGTCACCCTGCCCTTCGATGTGAAGAGGAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000000406:ENSGALT00000000553:5
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0379811=TRAM_LAG1_CLN8=FE(8.2=100)
A:
NA
C2:
PF0379811=TRAM_LAG1_CLN8=FE(15.5=100)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
No suggested primer sequences
R:
No suggested primer sequences
Band lengths:
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]