RnoINT0095769 @ rn6
Intron Retention
Gene
ENSRNOG00000056817 | Muc6
Description
mucin 6, oligomeric mucus/gel-forming [Source:RGD Symbol;Acc:628826]
Coordinates
chr1:214621950-214622671:-
Coord C1 exon
chr1:214622562-214622671
Coord A exon
chr1:214622102-214622561
Coord C2 exon
chr1:214621950-214622101
Length
460 bp
Sequences
Splice sites
5' ss Seq
TGTGTAAGA
5' ss Score
3.68
3' ss Seq
TAACCCTGTCTCCCCACCAGGTA
3' ss Score
9.67
Exon sequences
Seq C1 exon
CATCCTGCCCAGAGCCCAAGACCTTCCAGTCCTGCAGCCAGTCGTCAGAGGACAAGTTTGGAGCTGCATGTGCCCCCACGTGCCAGATGCTGGCCACAGGCACTGCCTGT
Seq A exon
GTAAGAAGCAGGGTGGAGAGGGTTTCTAAAAGTCTACAGGAGCCAGTACACAGCAGGACCATGCTGCACTCAGGGTCCCTCTGGTTGTGGCTCTGTCTCGATAACTAGTGCTGGGCATTGAGTCAGGAGCTGATTGGTAGCTAGGCAGTTAGAGGACAGGGTGCTTGTCTCTGGAATTCTTGAGGACATGGACTGGCTCCCGGCTTGGGAACTACAGCCACCTGTCTCTGAGTATGTGGCACACACACACACACACACACACACACACACACACACACACACACACACACACACACACCTGAAACATTACCCGAAGGGTGGCTTCTCTAAGAGTAAAACTCAGCTGTCCATAGAGACCTTAGAGAAGGCTGGACAAAAGAAAAGACACGGGTAGTCTCAAGGAGGCTGGTTCTGGGATTGCAGAATGCTTAAGGAGCTACTAACCCTGTCTCCCCACCAG
Seq C2 exon
GTACCCACCAAGTGCGAATCCGGCTGCGTCTGTCCTAAGGGACTCTATGAAAACAGTGACGGGCAGTGTGTGCCCGCAGAGGAATGCCCATGTGACTATGCAGGGACATCCTACCCTGGTGGTTCTGAGCTCCATACAGACTGTAAGACCTG
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000056817:ENSRNOT00000087497:20
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0182612=TIL=PU(53.1=91.9)
A:
NA
C2:
PF0182612=TIL=PD(43.8=54.9),PF0009313=VWC=PU(32.3=39.2)
Main Inclusion Isoform:
NA
Other Inclusion Isoforms:
NA
Associated events
Conservation
Human
(hg38)
No conservation detected
Mouse
(mm10)
No conservation detected
Chicken
(galGal3)
No conservation detected
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
CATCCTGCCCAGAGCCCAAG
R:
CAGGTCTTACAGTCTGTATGGAGC
Band lengths:
262-722
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]