RnoINT0099959 @ rn6
Intron Retention
Gene
ENSRNOG00000006783 | Neb
Description
nebulin [Source:RGD Symbol;Acc:1311134]
Coordinates
chr3:37678992-37679800:-
Coord C1 exon
chr3:37679696-37679800
Coord A exon
chr3:37679097-37679695
Coord C2 exon
chr3:37678992-37679096
Length
599 bp
Sequences
Splice sites
5' ss Seq
CTCGTAAGT
5' ss Score
9.63
3' ss Seq
CCTTTACTCTTTTTTCATAGCTT
3' ss Score
8.29
Exon sequences
Seq C1 exon
AAAAAGTACAAGGAAGATGCAGAGAAGTCCATGTCATATTACGAGACTGTCTTGGATACCCCAGAGATGCAAAGAGTCCGTGAGAACCAGAAGAACTTCAGCCTC
Seq A exon
GTAAGTCTCTATTCCACTAAAGCCCAGCCCACAGGTGGGATCCAGCAGCTAAACTGGGGTGGCTTTGGGGACACTCGCTTGGCATCTCATGAGGACAGAAGGGTGCACATGAATCTTCTCCAGGCTCACCTTGTGTTTTAATCCCAAGTGAGCATGACAGTCTCTCCTGATCAGTAGGTGTCCCCTTGTCATTGAGTACAAACCATTACTATCTTTTAACCAGTTTTTCAAACTGGTGATGTGTCCTTCTAAAACTAATTCTAAGCAAGAGATACTTTTAAATTTTTTAATGCACTTTGGGTTCTTAAAAATTGGTTTCTATTTCCGGGGGCACACGTAGCTTGGTGTTAGCGCGTATGTGCTTCGTCAGATGTGAGGTTCCAGGTTCAATCCCAGAAAGTCTCTAGCAATACCCCAGCACTAAAACTGATTTCTCTCCAAACGTATTAAAGAATTGACTTTGGCCGCCGCTTTGTGGTTGCCGTGGCGTGGGCTTTCATTAATGTGAAAGTTTAACCTCCCGGCCACGACACAGAATAATTATAAAATGTGTAAGAGAATGTTGAAATCTTAACGGGACCTTTACTCTTTTTTCATAG
Seq C2 exon
CTTCAATACCAGTGTGACCTTAAAAACAGTAAGGGGAAAATTACAGTGGTCCAAGACACGCCAGAAATACTGCGTGTTAAAGAAAACCAAAAGAATTTCAGCTCG
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000006783:ENSRNOT00000059461:99
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.429 A=NA C2=0.057
Domain overlap (PFAM):
C1:
PF0088013=Nebulin=PD(37.9=31.4),PF0088013=Nebulin=PU(55.2=45.7)
A:
NA
C2:
PF0088013=Nebulin=PD(37.9=31.4),PF0088013=Nebulin=PU(66.7=45.7)
Main Inclusion Isoform:
NA
Other Inclusion Isoforms:
NA
Associated events
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
AGTACAAGGAAGATGCAGAGAAGT
R:
CGAGCTGAAATTCTTTTGGTTTTCT
Band lengths:
206-805
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]