BtaINT0102032 @ bosTau6
Intron Retention
Gene
ENSBTAG00000002795 | NKTR
Description
natural killer cell triggering receptor [Source:HGNC Symbol;Acc:HGNC:7833]
Coordinates
chr22:15379991-15380728:+
Coord C1 exon
chr22:15379991-15380065
Coord A exon
chr22:15380066-15380620
Coord C2 exon
chr22:15380621-15380728
Length
555 bp
Sequences
Splice sites
5' ss Seq
CAGGTAAAT
5' ss Score
8.76
3' ss Seq
AATTTCTTTTTTTTTTCCAGGAG
3' ss Score
10.36
Exon sequences
Seq C1 exon
TTGGTCGAATTATGTTTCAGCTCTTTTCAGATATATGTCCAAAAACATGCAAAAACTTCCTTTGCCTATGCTCAG
Seq A exon
GTAAATGAATTATTAGATTATTTCCAATGAGAAGTCCTGGCTTAAAATTTTACCTTCCTTAACAGAATAGCTGTTTTCCTTAAAAAGTAATGGATTGTGAAATGAAAAATAAAAAATATTATTTTCACTGATAAGTCAGGGAAGCATTTCTTAAAGAGAGGAGAAAGAAATGGTCTCAAAAATTAAAAAGGAAGTACCACCATATGTAATGGAATCTTTATGCATTGTAGTTTAAAAAATAATAGCATGTATTCAAAACTGATTTATTTTGATAGAATTTTACAGATTTTAGTACTTTGAATAAATTTAGCCTTCCAGATCTCAATAAATTTACGATTAGAGGATAGAGAAGCAGAACATAATGATGTTGTTGTTACATGTAATTGGATTTATATTTTTAAACAGTAGATAAAATGGGGAGGAAAGACATTTATAATGTTGCTTATGTCTTAGAGTGTCCTATACCAGGGAGGAATTTGACAAAGAGCTAATTGAATGGTTGTTCCCATGGAAGAATATGTTTGTAGCTAAATTTAATTTCTTTTTTTTTTCCAG
Seq C2 exon
GAGAGAAAGGCCTTGGGAAAACAACTGGAAAGAAGTTATGTTATAAAGGTTCTACATTCCATCGTGTGGTTAAAAACTTTATGATTCAGGGTGGGGACTTCAGTGAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSBTAG00000002795:ENSBTAT00000030863:2
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0016016=Pro_isomerase=FE(26.6=100),PF132061=VSG_B=PU(19.7=46.2)
A:
NA
C2:
PF0016016=Pro_isomerase=FE(38.3=100),PF132061=VSG_B=FE(59.0=100)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
TGGTCGAATTATGTTTCAGCTCT
R:
CTTCACTGAAGTCCCCACCCT
Band lengths:
182-737
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]