GgaINT0010317 @ galGal3
Intron Retention
Gene
ENSGALG00000004110 | TOMM34
Description
NA
Coordinates
chr20:5190815-5191677:+
Coord C1 exon
chr20:5190815-5190959
Coord A exon
chr20:5190960-5191550
Coord C2 exon
chr20:5191551-5191677
Length
591 bp
Sequences
Splice sites
5' ss Seq
CAGGTACTG
5' ss Score
9.04
3' ss Seq
ACCAGGTGTCTGTATTGCAGAGC
3' ss Score
7.39
Exon sequences
Seq C1 exon
CCCAGACTGCTGCTGGCATAGAGAGAGCTCAAACTCTTAAGGAAGAAGGAAACAAACTCGTAAAGAAAGGAAACCATAAGAAGGCAATTGAGAAGTACAGTGAGAGTTTAAAGCTGAACCAGGAATGTGCAACTTACACCAACAG
Seq A exon
GTACTGCCCAAGTGCTTTTTGGCATTTTACAAAAGCCACTTTGGTACTTCTGACACAGCTGCCTGATGTTTGTCCCAGACAACTGAATTAAAGAAAAACAACCAACAAACACCCACACGTTTCCCCCGAGCACAATCTTCCCTGTAGTTTGTATAATGTTCTTTGATCAGATTCTACAACAAGCCCTAAAGCCACTCAGCTTAGCACTGCTCGGGGCTTCCTCCCTTTAATGCCTGTCTGCCAGGACTGTGTCATTTTGTTATTTGTGTCTGCTGTCCCCTGAGCCACAAATTGCACACTGCTGTACTTAGAGTGTACTTCTGAGATGAGCAGAGCATGTTGCAGAGTGGTAGAGTTAGGAGCACGTTGCTGTAAAAATGCTTTTAAGGGGTCTTTTTTTTTTTGCAGACTGAAAAACTGTTTGCTACTTTTTGCTCTTTTTACCTTAACCAAGCATTGAGCTCTGACCAATCATTCCCAAGCACACTCCCTGTTCTGGCAGTCCAGCTTTGTGCTGCAGTTAGTCCTCTGCACTGCAGCAGTAAATGCTGCTTTTAACCAAAGGTCTCTAACCAGGTGTCTGTATTGCAG
Seq C2 exon
AGCTCTCTGTTACTTGACTCTGAAGCAACACAAGGAAGCAGTCCAGGACTGCACAGAAGCTCTGCGATTAGATCCTAAAAACGTTAAGGCGTTCTACAGACGTGCTCAGGCACTTAAAGAACTGAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000004110:ENSGALT00000006537:5
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.449 A=NA C2=0.116
Domain overlap (PFAM):
C1:
PF0051523=TPR_1=WD(100=69.4),PF134141=TPR_11=PU(11.8=16.3)
A:
NA
C2:
PF134141=TPR_11=FE(61.8=100)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
TGCTGGCATAGAGAGAGCTCA
R:
CTTCAGTTCTTTAAGTGCCTGAGC
Band lengths:
262-853
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]