Special

GgaINT0057997 @ galGal3

Intron Retention

Gene
Description
NA
Coordinates
chr5:358371-359245:+
Coord C1 exon
chr5:358371-358542
Coord A exon
chr5:358543-359162
Coord C2 exon
chr5:359163-359245
Length
620 bp
Sequences
Splice sites
5' ss Seq
TGGGTGAGT
5' ss Score
8.73
3' ss Seq
TCTGCTGCTCTTTTCCCCAGAGA
3' ss Score
10.19
Exon sequences
Seq C1 exon
GTGCAGGAGCTGCAGCTGGAGAGGGAGATGGCACTCGCTGCCAACCGCAGCCTTGCTGAGCAGAACCTGAAGTTCCAGGTCCCGCTGGAGACCGGACGTTCTGAGCTCTCCAGCAAGTATGAGGAGCTGCAAAAGCTCGCCGAGCACTGTAAGGAGCAGAAGGCAAAGCTGG
Seq A exon
GTGAGTGACTCCAGTCTCGCTTCCTTTCGTAGAATTGCAGAACCACACAATGGTTGGGTTGGAAGGGACCTCAAAGCCCTCCCCTCTCCCCCAGCCCCAGTTCCTGCCGTGGGCTGGTTGTCCCCCAGCAGATCGGGCTGCCTGGGGCCACATCCAGCCTGGCCCTGGGTATCTCCAGGGATGGGGCACCCACAGCTCCCTTGGACAGCTGTGCCCGGGCCTCACCGCCCTCTGAGTAAATAATTTCCTCCTTACACCTAACCTAAATTTCCTATCTTTTAGTTTTAAACCCTTCTCCCTTCATTCTGTCCCTCTCTGCCTGTGTAAAAGATCTTCCTCCCCTGTTTATAAGCTGCCTTTAGATACCAATCAGGTGTGGCAGTGGTTAAGGCTGTTTCCTCATCAGATTTTTTCCTTACACCAACATTTTCCAAGGCAGGAAGGCGCTCTTGGAAGTGCACGTGGGGCACAGAAACGTGACAGTGAGGAAGAGAGCTCCTTCTGCTTTAGGTTTTCCTTGTGTCACAGTGCAAAGCTGTGCGATAGGTGACAGGCTCTGTTGGACAGGTCAGTGTTTTTGCCCTGTTCTGTGTTTATTTCTCTGCTGCTCTTTTCCCCAG
Seq C2 exon
AGAAATTTTCAGCCTCAATGCATCCTCAGATGTTGCTGGATCTCCTGCAGGTGGAAAGCCAAAAAATTGAAGAGGAGTCTGAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000005197:ENSGALT00000008347:3
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.086 A=NA C2=0.250
Domain overlap (PFAM):

C1:
PF072008=Mod_r=FE(38.0=100),PF133241=GCIP=PU(62.6=98.3)
A:
NA
C2:
PF072008=Mod_r=FE(18.0=100),PF133241=GCIP=FE(29.7=100)


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Primers PCR
Suggestions for RT-PCR validation
F:
CTGCAGCTGGAGAGGGAGAT
R:
GCTTTCCACCTGCAGGAGATC
Band lengths:
222-842
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]