Special

RnoINT0087331 @ rn6

Intron Retention

Gene
Description
leucine rich repeat and sterile alpha motif containing 1 [Source:RGD Symbol;Acc:1564403]
Coordinates
chr3:11974261-11974993:-
Coord C1 exon
chr3:11974912-11974993
Coord A exon
chr3:11974407-11974911
Coord C2 exon
chr3:11974261-11974406
Length
505 bp
Sequences
Splice sites
5' ss Seq
CAGGTACTT
5' ss Score
8.17
3' ss Seq
TGCTCCTCTGATTTCCTCAGAGT
3' ss Score
8.55
Exon sequences
Seq C1 exon
GTGGGTGTCTCAGAAGCAGGCCTGCAACATGAAATCCTGCGAAGAGCCCGGGACCTGCTGGATGTGGCCAGGGTCCAACCAG
Seq A exon
GTACTTATGCTAGGCTCTTCCCCGAGCTGTTTGGAGGCCCAGCTATATCGGGCTGCAGTTGGCAGCCTAGGGGCCGCTGACTCCAGGGCAGAGCTATAGGCACAGAGCGGGCTGTGCTGGGGAGAGGACTTCGGACTAAGGAGGCAGCCTTGGGGCATCCCCTTGTGCCATCACCTGGTGGACCCATTCTGTTTCCTGGGAAGCCTGGTAGAGAAGCTCAGCCACTAGACACTGGTCCTCTTCTGCAGCTCCACCACTAGGTGGCGATATGGCCCTAAGCACACAATGTCCTCAAGCTGAGTGTACAGTAGCTGGGTAGAGAATTCACTCGCATCTCACAGATGGACACGAGGAATGACTGGGGCCGAGAGGAAGAGCTTTCCCCTGCTCTTGGACTGGAGCCACCCCCTCCTTTGCCCCCCCCCCCCAGATCACTCCCACAAGCCAGGATTGGGATCATCTGGGGATGACCCCCTGGCTTAGCCTGCTCCTCTGATTTCCTCAG
Seq C2 exon
AGTTGAAACCACCCAAGAATGAGGTCTTTGGTGTCTCTGAGCCCCCCACAGCCCCTCAGGAGCTTCCTGAGTCCGTGAGACCATCTGCCCCGCCAGCTGAACTGGACGTGCCGACCTCAGAGTGTGTTGTGTGCCTGGAACGTGAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000022312:ENSRNOT00000060186:23
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.000 A=NA C2=0.551
Domain overlap (PFAM):

C1:
PF0764712=SAM_2=PD(32.2=67.9)
A:
NA
C2:
PF139201=zf-C3HC4_3=PU(23.9=22.4)


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
NA
Associated events
Conservation
Zebrafish
(danRer10)
No conservation detected
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
GTGGGTGTCTCAGAAGCAGG
R:
TTCCAGGCACACAACACACTC
Band lengths:
222-727
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]