Special

BtaINT0050097 @ bosTau6

Intron Retention

Gene
Description
dynein, axonemal, heavy chain 1 [Source:HGNC Symbol;Acc:HGNC:2940]
Coordinates
chr22:49078647-49079502:-
Coord C1 exon
chr22:49079397-49079502
Coord A exon
chr22:49078827-49079396
Coord C2 exon
chr22:49078647-49078826
Length
570 bp
Sequences
Splice sites
5' ss Seq
CAGGTGGGT
5' ss Score
8.56
3' ss Seq
CTGCTTCCCCCCAACCCCAGCTG
3' ss Score
7.11
Exon sequences
Seq C1 exon
ATTCTACTTCCTATCTGATGACGAGCTGCTTGAGATCTTGTCCCAGACAAAGGACCCCACCGCCGTGCAGCCCCACCTGCGCAAGTGCTTCGAGAACATCGCCCAG
Seq A exon
GTGGGTACCTGGGCCAAGGGCTCAGGTGCCCTGAGGGCACCGTCCCAGGGAGGATACCTGTTCTCTCACCCCAAGTCTTTTTAGCAGGGAATGAGATCCCAGGCCCTCGGAGACATCTCTGGGGTCTGTGGGAGGAGGGTCAGCTCCCTCAGCGCAGGGTTGGGGAGCTCTTGATCCCAGCTCATCCAGGGGTACCCTGGCCCCCCTGCAATCCACTGAGGTGCTGACTAGGCTGAGAAACCCAAGAGGTCAGAGGCTGCTGAATCCCCTCGTCCTCATCTTCATTTACAAGGGAGGCCTCACAGGCCTGTGGGAGGGGGGGATGGGGGGCACTCGCAGGGCAGGCTTAGCCTCCTTCCCCAAGTGGCCGGGGCCACAGCTGGAGCAGGCAGATCCGTCCTGCCCACGAAGAATCAGGGGAGGTCCAGCCAAGGGGAGCTCTCTTCCAGAGGCGAGAGCCATCTTCTGAAGGTGGAGGACACAGGCGGGGTCCACGCTGGGGCTCTGGTGGGCAGGGCCTCTGGACACACTGAGGTTCACCCCACTCTCACTGCTTCCCCCCAACCCCAG
Seq C2 exon
CTGCTGTTTCAGGAGGACCTGGAGATCACACATATGTACTCGGCAGAGGGTGAGGAGGTGCAGCTGTCCTTCTCCATCTACCCGTCCAGCAACGTGGAGGACTGGCTGCGGGAGGTGGAAAACAGCATGAAGGCCAGCGTGCGGGACATCATCGAGAGGGCCATCAAGGCCTACCCCAGG
VastDB Features
Vast-tools module Information
Secondary ID
ENSBTAG00000047794:ENSBTAT00000066095:23
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):

C1:
PF083938=DHC_N2=FE(8.5=100)
A:
NA
C2:
PF083938=DHC_N2=PD(14.1=96.7)


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
NA
Associated events
Conservation
Primers PCR
Suggestions for RT-PCR validation
F:
ATTCTACTTCCTATCTGATGACGAGC
R:
CCTGGGGTAGGCCTTGATGG
Band lengths:
286-856
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]