Special

DreINT0062596 @ danRer10

Intron Retention

Gene
ENSDARG00000011445 | elmsan1a
Description
ELM2 and Myb/SANT-like domain containing 1a [Source:ZFIN;Acc:ZDB-GENE-041001-151]
Coordinates
chr20:25991860-25992686:-
Coord C1 exon
chr20:25992583-25992686
Coord A exon
chr20:25991936-25992582
Coord C2 exon
chr20:25991860-25991935
Length
647 bp
Sequences
Splice sites
5' ss Seq
ATGGTGAGC
5' ss Score
8.27
3' ss Seq
ATTATTTTTTAATTCTGTAGGAA
3' ss Score
8.43
Exon sequences
Seq C1 exon
TTGATAATCTGATGAACCTGGTCTGTTCCAGTGTAATGTATGGGGGAGGGACAAACACAGAGCTCGCAATGCACTGCCTGCATGAGTGCAAAGGTGATGTCATG
Seq A exon
GTGAGCTCAGAATAATGTTCAACAACATCTTTCAAGACAAATGTATTTGTGAATTATTCTGCTTTGTGTCTAATGCAATAGATTTTGTTGAATTTAAAGGACTGTCACTGCTGTTTAAAAGTTTTGGGTCTGTAAATATTTTGAAATGCTGTTGAAAGATTTATTTTATGCTTAATACGGCTACATTTATCTATTAAAATACTAATTCAGCAAAGCAGTTAAATTGAAATGTTATTACAACTTATAATTCTGTTATTCTTTTATAGTACAATTTTTTCCTTGAAAAACACTCTTCAATGTCACATGATATTTCAGAAATGATTCTAATATGATGATTTGTAGCTCTTTTACACTTTATGAAACATTTATTTAATTGCTATTTTAATTTTCCATTTCCCCAATTTCAGCAGTGTATCTATCTATCTATCTATCTATCTATCTATCTATCTATCTATCTATCCATCTATCCATCTATCCATCTATCCATCCATCCATCCATCCATCCATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATATGTATGTATGTATGTATGTATGTATATGATTTCTGGAGAAACAATTATTTTTTAATTCTGTAG
Seq C2 exon
GAAGCTTTGGAAATGATGATGCTGAAAAATCCCATCTTCTCCTGGAACCACCAACTAGCCAATTACCATTATGCAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSDARG00000011445:ENSDART00000142611:7
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):

C1:
PF0144819=ELM2=PD(20.4=31.4)
A:
NA
C2:
NO


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
Associated events
Primers PCR
Suggestions for RT-PCR validation
F:
No suggested primer sequences
R:
No suggested primer sequences
Band lengths:
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]