GgaINT0066432 @ galGal4
Intron Retention
Gene
ENSGALG00000015373 | PDE6B
Description
Phosphodiesterase 6b subunit [Source:UniProtKB/TrEMBL;Acc:F1NA42]
Coordinates
chrZ:53323718-53324554:-
Coord C1 exon
chrZ:53324411-53324554
Coord A exon
chrZ:53323784-53324410
Coord C2 exon
chrZ:53323718-53323783
Length
627 bp
Sequences
Splice sites
5' ss Seq
CTGGTAATG
5' ss Score
5.67
3' ss Seq
TGTGTCCATGCTCTTTGCAGCCA
3' ss Score
9.18
Exon sequences
Seq C1 exon
TCCCTGACACAGTTTCTGGGCTGGTCTGTACTCAACACAGATACGTATGATAAGATGAACAAACTGGAGAACCGGAAAGATATTGCCCAGGATATGGTGCTCTACCACGTGAAGTGTGACAAGGATGAAATTCAGGAAATTCTG
Seq A exon
GTAATGCCTGGCAATGTACAGCACTCCTGTGAGCATAGTGGCCTGGCCTGTGCACGACAGCCTGGTCAGTGTGGAACAGCAGCTGTGTCTGTGGGCCAAGATCTCCCATCCCATATAAAGTGTTCCAGCCACGGAGGCCGCACCCAGGCCTTAACACTGTAGCAGAACAAGTCTTTATTATGACTTGAGGCTGACTGTGGTCTGCTCTCTGCCTCAGCACACTGTGCTGGGATCCTTTCTAATTTCCTCAGCAAAACCAGGCCTGGAGGTGGGCTCATGCAGATACTGCTCAGGGCAGGCTGTGGGTTGTGAAAGAGGAGCTAGTTTATACCCTAAAACCACCTTGGTACAGAGGATGTGGAGTTGCTAAGCCTGGCTGAGACACAGGTAATTTTCAAGGGGAATTTTTCAAGTGGAGGAAAAACAAGCCAAAGTTAATGCAAGAGATAACGTTCCTACAAGGAAGAACATGTTGAAAGATCAGAAATAAAAGTAAGGTCTGAGAGGAAAACATGATCTTCATATCAGAGCTGCCTCCTATAGGTTCACCCTAGATTACCCCAAGCTGTACAGCACACAGTCCTGTGAGATACAGTAGTCAGTGTAATGTGTCCATGCTCTTTGCAG
Seq C2 exon
CCAACACGAGAAAAGCTGGGGAAGGAGCCAAGTGAGTGTGAGGAAGAGGAGCTGGCAAGTATCCTG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000015373:ENSGALT00000032798:10
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.182
Domain overlap (PFAM):
C1:
PF0159021=GAF=PD(5.1=18.8)
A:
NA
C2:
NO
Main Inclusion Isoform:
NA
Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
CCTGACACAGTTTCTGGGCTG
R:
GGATACTTGCCAGCTCCTCTT
Band lengths:
206-833
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]