GgaINT0108368 @ galGal3
Intron Retention
Gene
ENSGALG00000016823 | F1P3E8_CHICK
Description
NA
Coordinates
chr1:141541362-141542221:-
Coord C1 exon
chr1:141542055-141542221
Coord A exon
chr1:141541444-141542054
Coord C2 exon
chr1:141541362-141541443
Length
611 bp
Sequences
Splice sites
5' ss Seq
CAGGTTAGT
5' ss Score
8.02
3' ss Seq
ACGTATGTTTGTTTTTACAGAAA
3' ss Score
9.47
Exon sequences
Seq C1 exon
GTTTGAGTATCTATTTAATTTTGACAATACTTTTGAAATTCATGATGATATAGAAGTACTAAAACGAATGGGAATGGCCTGTGGGCTAGAATCTGGAAGCTGTTCAGCAGAGGACCTAAAAATTGCAAGGAGTTTGGTTCCCAAAGCTTTGGAACCATATGTGACAG
Seq A exon
GTTAGTTAGTGTAAGAAGAACTGTTTTGTTTTTCTTCTTTTTGGTTCCCTTTCCTTTTTTTTTTATGAACAAAACTCATGGAAATGTTTCAGCTAATTTCCGCTGGTTTGTGCTGTAGGGTTTATAAGTTTTCAAATGTTTGTGCTTTTTCATGTACTTTGGGGAATGGGTAACATTCTTAGTGAATGGACTGTTGCTGTTTGCAGCACCAGTTTTTGCGTTGCCCCATGCAACCTTTTCATTATGTAATTTGTTTTATTGGGTTTTTTTTTTGTTTGTTTGTTTTTTGAGGACATTCCTTGTAGTTGATTCATCTGCAAAGGGAAAAGGTAGTAAGTGCAAACCTGGTCATGGCTTCATTTTATTTATTCATCTTCCATGTACAGGAATACTGAAGACATCTGGCTTGCTCACTTCAAAATAATGTTTATTTTAAAATGATGCAGTCATTAGCTTGTTAATTAAGAAATGTTGGGTGTAGGGCGTCAATATGTTTCATTGGGTTGGCTGCAAGACTCATTCTCTGGACTCCAAAAAGAATAAAGCATTTTTACTGAATTAGATAAGTGTGTTTGGAAGTAGTGTTGAGATACGTATGTTTGTTTTTACAG
Seq C2 exon
AAATGGCTCAGGGATCAATCAGCAGTGTATATGTCACATCTTCGTCAGGTTCCACATCAAATGGCACAAGATTTTCAGCCAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000016823:ENSGALT00000027160:9
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.286
Domain overlap (PFAM):
C1:
PF087815=DP=FE(38.6=100)
A:
NA
C2:
PF087815=DP=PD(5.5=28.6)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
AGAAGTACTAAAACGAATGGGAATGG
R:
CTGGCTGAAAATCTTGTGCCA
Band lengths:
198-809
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]