Special

GgaINT0120276 @ galGal4

Intron Retention

Gene
ENSGALG00000013007 | CACNA2D4
Description
calcium channel, voltage-dependent, alpha 2/delta subunit 4 [Source:HGNC Symbol;Acc:HGNC:20202]
Coordinates
chr1:61210422-61211193:-
Coord C1 exon
chr1:61211133-61211193
Coord A exon
chr1:61210573-61211132
Coord C2 exon
chr1:61210422-61210572
Length
560 bp
Sequences
Splice sites
5' ss Seq
CTGGTAAGC
5' ss Score
8.69
3' ss Seq
TACTCTTTTTTTTTATTGAGGTA
3' ss Score
-2.89
Exon sequences
Seq C1 exon
GAATAAAGTGGCTACCAGATGAGAATGGGGTCATCTCCTTCGACTGCAGGAACCGTGGCTG
Seq A exon
GTAAGCATTGTGGAGAAAGTTGGTTCTCCCCTCTCCCTCTTTTCAAGGTGACACCTGGGGAGCTGCTGACCAGCAGTCACTATGCCATGCTGTTTGTGCAGGAGAAGGGTACATAAATAGAGGCCTGACACCAGACAGTGCCAGCTTTCCACAGGGAATCTGACACGTGCCACATGGAAAGTACTGCATGTGCATCCTTCCTCTGTCCCATCCTTCTTAATCGTGCAGCTAGAGGAATGGGGCTGTTTACACAGAAAGGCAGGCATTGGCTCAGTTTGTCCAGCACAGCTGAATGGTATAGTAGCAGTTGTCACTCTTGGCTGAAACCTGGGCATATGTCTGCAGCTGTCCCAGCTCTTGTCCCTGTGTGAAGAGGCTGGAGTCAGTGGGAGGGGCAGGCGGGTAGCAAGAGCCCTGCTGGTGAAGAGTTGGACCCTGTGGGATAGCCATACTCACAAGTGCATGTTATGCTGTGGCTCACATCACCCAGATGCGTATGCCCAGAAATCTTCCACTCCACACTCTCACCATGGTTTCTTGTACTCTTTTTTTTTATTGAG
Seq C2 exon
GTACATCCAAGCAGCCACATCTCCCAAGGACATCGTCATCATTGTGGATGTCAGTGGAAGCATGAAGGGCCTGCGGATGACCATTGCCAAACACACCATTGTCACCATTCTAGATACTCTTGGGGAAAATGACTTTGTCAATATCATTGCA
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000013007:ENSGALT00000037501:7
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):

C1:
PF083996=VWA_N=PD(2.6=14.3)
A:
NA
C2:
PF137681=VWA_3=PU(24.7=80.4)


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
NA
Associated events
Other assemblies
Primers PCR
Suggestions for RT-PCR validation
F:
GAATAAAGTGGCTACCAGATGAGA
R:
TGATATTGACAAAGTCATTTTCCCCA
Band lengths:
207-767
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]