GgaINT0125706 @ galGal3
Intron Retention
Gene
ENSGALG00000001037 | SCAI
Description
NA
Coordinates
chr17:10267110-10268000:+
Coord C1 exon
chr17:10267110-10267262
Coord A exon
chr17:10267263-10267898
Coord C2 exon
chr17:10267899-10268000
Length
636 bp
Sequences
Splice sites
5' ss Seq
CAGGTAAAA
5' ss Score
8.59
3' ss Seq
TCATTTTCCTCTTTTTATAGGTG
3' ss Score
11.71
Exon sequences
Seq C1 exon
GCAGACCCTGTAATGGTTTTAAATGACGACAACACCATTGTAATCACCTCCAACAGGCTTTCTGAAACTGGAGCTCCATTGCTGGAGCAGGGAATGATAGTGGGACAGCTTGCTCTTGCAGATGCACTGATTATTGGGAACTGCAATAACCAG
Seq A exon
GTAAAAGTAATCATGAGGTCTTAAACTTGTATTGTTACAGCTCAAATTCTCTCCCTCTCAGTGATATCTCTTAATCATACAGCAGAATATCTAGATTATTGCAGTAGAGGCTAGATAAAATTGTTTTTCATATAACAGGTTGTTCTTAGCAGTGTTCGTGCTTGAAGGGTCTCAATGGAACCTTTTGTTCCAGCTTCAGTTGCTACAGGAATGGATTTTCACAAGATTTTCAGGGTCTTGTTTTTTAGATGACGATGGTAGTGAGACTGTGCATACTTTGTGATTTATCTCTGAACTCTTTTTCTAGTAAACAGCAGAGCTGGATCTAAACTAGAGTTTGTGTATCTTCCAAATAGTGTCTAAATACAGAGTACAAGGGGGATTCCATCACATGATTTGTAAACTACTCAGAAAAGTCTAATTTGTGAATGTGGTAAACTGACCTGGTAGAGCTGTAGTAAGTAGACTTTGTCCTGTATGAACTCCTCAAAGTCATTCACAGGTCTTTTGAGTTTCAGAGATGATACTGTCAGAAAGTGGTGTGTGGGATGCAGTTGAGACTCTCAGATAATTCCAAAGAAAAACAGACTGCTTAACTTGTATCTGCCAGAGTAAATCATTTTCCTCTTTTTATAG
Seq C2 exon
GTGAAGTTCAGTGAATTGACAATTGATATGTTCCGAATGCTGCAAGCACTTGAAAGGGAACCAATGAATTTAGCTTCGCAGATGAACAAACCTGGAATGCAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000001037:ENSGALT00000001535:7
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.324
Domain overlap (PFAM):
C1:
PF120703=DUF3550=FE(10.5=100)
A:
NA
C2:
PF120703=DUF3550=FE(7.0=100)
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
GCAGACCCTGTAATGGTTTTAAA
R:
TGCATTCCAGGTTTGTTCATCTG
Band lengths:
254-890
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]