RnoEX0060457 @ rn6
Exon Skipping
Gene
ENSRNOG00000019322 | Notch1
Description
notch 1 [Source:RGD Symbol;Acc:3187]
Coordinates
chr3:3912675-3914288:-
Coord C1 exon
chr3:3914140-3914288
Coord A exon
chr3:3912954-3913170
Coord C2 exon
chr3:3912675-3912762
Length
217 bp
Sequences
Splice sites
3' ss Seq
CCTGCCGCCCCTGCCCGCAGGTG
3' ss Score
12.99
5' ss Seq
CAAGTGAGT
5' ss Score
9.1
Exon sequences
Seq C1 exon
CTCCATCGTCTACCTGGAGATCGACAACCGGCAGTGTGTACAGTCATCCTCGCAATGCTTCCAGAGCGCCACCGATGTGGCTGCCTTCCTAGGTGCTCTTGCCTCCCTCGGCAGCCTCAATATCCCCTACAAGATCGAAGCCGTAAAGA
Seq A exon
GTGAGACGGTGGAGCCTCCGCTGCCCTCACAGCTGCACCTCATGTACGTGGCGGCAGCTGCCTTCGTGCTCCTGTTCTTTGTGGGCTGTGGGGTGCTGCTGTCCCGCAAGCGCAGGCGGCAGCATGGCCAGCTCTGGTTCCCTGAGGGTTTCAAAGTGTCAGAGGCCAGCAAGAAGAAGCGGAGAGAACCCCTCGGCGAGGACTCAGTCGGCCTCAA
Seq C2 exon
GCCCCTGAAGAACGCCTCAGATGGTGCCCTGATGGACGACAATCAGAACGAGTGGGGGGACGAAGACCTGGAGACCAAGAAGTTCCGG
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000019322-'32-35,'32-32,33-35
Average complexity
S
Mappability confidence:
100%=100=100%
Protein Impact
ORF disruption upon sequence exclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=0.233 C2=0.733
Domain overlap (PFAM):
C1:
PF076847=NODP=FE(79.4=100)
A:
PF076847=NODP=PD(14.3=12.3)
C2:
NO
Main Skipping Isoform:
NA
Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
TCCATCGTCTACCTGGAGATCG
R:
CCGGAACTTCTTGGTCTCCAG
Band lengths:
236-453
Functional annotations
There are 2 annotated functions for this event
PMID: 16530045
Encodes an experimentally validated Eukaryotic Linear Motif (ELM). Method: inferred by author. ELM ID: ELMI002957; ELM sequence: LWFP; Overlap: FULL
PMID: 20028974
Encodes an experimentally validated Eukaryotic Linear Motif (ELM). Method: coimmunoprecipitation, inferred by author, isothermal titration calorimetry, x-ray crystallography. ELM ID: ELMI002957; ELM sequence: LWFP; Overlap: FULL
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]