Special

RnoINT0048599 @ rn6

Intron Retention

Gene
Description
dynein, axonemal, heavy chain 1 [Source:RGD Symbol;Acc:621795]
Coordinates
chr16:7366867-7367747:-
Coord C1 exon
chr16:7367574-7367747
Coord A exon
chr16:7366906-7367573
Coord C2 exon
chr16:7366867-7366905
Length
668 bp
Sequences
Splice sites
5' ss Seq
TGGGTGAGT
5' ss Score
8.73
3' ss Seq
TCTGTCTCTCAACCCTGCAGATG
3' ss Score
10.93
Exon sequences
Seq C1 exon
GAGCCTTCAAGAACCTGGTGGATATCAACTTTGTCTGTGCCATGGGTCCCCCAGGGGGAGGCAGGAACGCCATCACTCCAAGGCTGACACGTCACTTCAACTACCTGTCTTTCATTGAGATGGATGAAGTCAGCAAGAAGCGCATCTTCTCTATAATCCTGGGATGCTGGATGG
Seq A exon
GTGAGTGTCAGATTGGGCCAAGAGAGGCCATGGACAAAGTTTGTTGTCACAGCAAAGACAGCCGAGCGGCACTGGGCGGAAAGAAGGCCCTGAGCTACTAACTGCAATCCCAGCCTTTACTCTGCTGTTTCATCCAGCAAGTTCACGGCTTCTTTACCAACCGATGCTAATACTAGTACTCGTCGCTCCGAGTCTTGGGAGTTGGGTAATATGTGATACAGCATCTAACATAAAGCCATGCAGTAAATCTGCATACTGCGTGTGTGATAGACATGTGTCTCCGCGTTTGATTCGCTCGTGTAGAGACATCGTAAGCGCTTGCGGAATGACCACCACTTTTCTAGAACAGGAAAACCTAGAAAGACCAAAGGGGGAGCTTGGGAAAAGTCAGCCCGGATGCTTTTCTCCAGTAGCCCGCCTCCCACCCAGCACACCCTGTCCATGAAGCACACTGGCAATGCTGGAAGTCAAGCCTTCCATCCGGCCTGGGCTACCCTGCCAGACCCTGAACCAAGCCTCCCCTTCATGCACAGCTGGGGAAAGGGCATACTCTCTGATGAAGGAGAGGAAGAAGTGGCTTCAGGAGCTTCCTAGGGGGCCGCAGCTGGCCTAGGTGGGCAGCAAGTAATCACCTAACTGAATCTTATGTCTGTCTCTCAACCCTGCAG
Seq C2 exon
ATGGACTCCTTGGAGAGAAAAGTTACCGAGAGCCTGTGC
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000026914:ENSRNOT00000035009:46
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):

C1:
PF127752=AAA_7=FE(20.4=100)
A:
NA
C2:
PF127752=AAA_7=FE(4.6=100)


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
Associated events
Conservation
Primers PCR
Suggestions for RT-PCR validation
F:
GAGCCTTCAAGAACCTGGTGG
R:
GCACAGGCTCTCGGTAACTTT
Band lengths:
213-881
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]