DreINT0133589 @ danRer10
Intron Retention
Gene
ENSDARG00000079414 | sez6b
Description
seizure related 6 homolog b [Source:ZFIN;Acc:ZDB-GENE-110628-3]
Coordinates
chr15:24554502-24555356:+
Coord C1 exon
chr15:24554502-24554670
Coord A exon
chr15:24554671-24555189
Coord C2 exon
chr15:24555190-24555356
Length
519 bp
Sequences
Splice sites
5' ss Seq
CAGGTCAGT
5' ss Score
8.94
3' ss Seq
TGTTCTGTTGACGCTTGCAGGTT
3' ss Score
8.89
Exon sequences
Seq C1 exon
TGGCCTGCGGTGGAATGGTGAAGAATGCGACTCTCGGCCGCATTGTGTCTCCTGGTTTTCCAGGCAACTACAGCAACAACCTAACCTGCCACTGGGTGCTGCAAGCCCCTGAAGGCCACCGGCTGCATGTGCACTTCGAGAAGGTGGCCCTCGCTGAAGACGACGACAG
Seq A exon
GTCAGTCCCAGTCAGCTATTCTTCACTAATTAGTCATATGATGCTCTATAAAGTCAGTCAGAGTGTCTGTTCACAGTGCAGTCATACTCCAAATGTGGCGTTGCTCTTCAGGGCGTTATATGATACAGCAAGAGCAAGGCATGATAGGAAGAACTGCGACTGCAAGAGTGAAAGTGGATGAAAGTTTCTGAGATCAGACACTTGCTCTCCTTTAAAATAATTTAGAATAATCAAACCCCCTCATGCAGGCGTGGAGAGAGTGATTAGAGCCCACTCCGGGGCCTCAGGAGGGGGATTAAGTTATTTTTATTAGCAGTATCCGCTTTTTTCTGCAGGCTTTGCTAACAAATGGACTTTTAATGAGGTCACTTGCTGCTCAGCTATTCAAAATCATATCAGGCGATTATTATGCAAACTGCCAAAAGACAGTACTAGAAATCGGAGGAACGTTACGTCTGCTGCCAAACAGATTTGCTGTTTTAAAGGAGCTCAACTCTTCTGTTCTGTTGACGCTTGCAG
Seq C2 exon
GTTTTTGATCAAAAACGGCAACCATATTGACTCACCCATCGTGTATGACTCGTATGAGGTGGAATACCTTCCTAATGAGGGAGTCGCTAGTTCCTCCAGACATCTCTTTGTGGAGTTCACTACAGATGGTTTCGGCACCAACACAGGAATGGCCATCCGATATGAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSDARG00000079414:ENSDART00000155502:6
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0043115=CUB=PU(49.5=94.7)
A:
NA
C2:
PF0043115=CUB=PD(49.5=94.7)
Main Inclusion Isoform:
NA
Other Inclusion Isoforms:
NA
Associated events
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
GCCTGCGGTGGAATGGTG
R:
CTTCATATCGGATGGCCATTCCT
Band lengths:
334-853
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]