Special

GgaINT0017798 @ galGal4

Intron Retention

Gene
Description
CDC-like kinase 4 [Source:HGNC Symbol;Acc:HGNC:13659]
Coordinates
chr13:13446391-13447252:+
Coord C1 exon
chr13:13446391-13446450
Coord A exon
chr13:13446451-13447094
Coord C2 exon
chr13:13447095-13447252
Length
644 bp
Sequences
Splice sites
5' ss Seq
TTGGTGGGT
5' ss Score
4.3
3' ss Seq
GTTTTTGTTGTGTTTTTCAGGAG
3' ss Score
11.24
Exon sequences
Seq C1 exon
TTGTGCATGTACCTGTTTGAACACCGAATTCCTGCATATAACGTCCAGCAACGGAAGTTG
Seq A exon
GTGGGTTTTGTCTTTGGCAAGTCAGCTGTATTGTGGAGCACCTGCACTCGTGTGCTGGCAGAGTTCAAAACCTGTGGCTTGGCTCGTGGTACCTCAGTTAGGTTAATTTATCAACGTGAGCTGTGTGATTACTTAAAAAAAAAAGAAAAACCAGCAGTGATTTGTATGCAGGTTTGTGGGATGTATTTGAGGCCAGCTGGACATACATGGCTTTCATGTAGCAACTTATGTACTGATGGTATGAAGAGCTAAATCTGCAGTTTGTCGGAATATTTGAAGGTTAAGGTCTCTCCAGGAGAAGTCTCTTTAAGGAAATGATTCTCTGTAGTCACTTGAGAGTTTATTTAAAACATGCTCTAATAACATGTTTGAAGCTATTAGGCAAAGATGAGTTGGCCCATTTAGCCTTGATTTGCGTTTCGTAACAGTGTTAGGATGGGAAAACTGTCTGCTCACCTAAATAATGTGAGGGAGAAGCTGAGGAAGAATTGAGGAAATGGTTTTCTAGCTGTGTCATTTGATCAAACTGCAGTAATGGACTCACAGCTACAAATATCAATGTAACACTTTTGTCTTCTGTGTGTTTTTGTTGTGTGTTGTTTGTTTGGTTTGTGTTTTTTGTTTGTTTTTGTTGTGTTTTTCAG
Seq C2 exon
GAGCAGATGCGTCACTCAAAACAAAGCCACTGCCCTGAGTGGGATGACAGGAGGAGCTGGGATCAGAGAAAGCACAGCAGCAGCCGGAAACGCAGGAAACGGTCCCACAGCAGTGGACAGGAAAGCAAGCACTATAAACCAAATCATGTTTCTGAAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000006057:ENSGALT00000009766:1
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion (1st CDS intron)

No structure available
Features
Disorder rate (Iupred):
  C1=0.333 A=NA C2=0.906
Domain overlap (PFAM):

C1:
NO
A:
NA
C2:
NO


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Primers PCR
Suggestions for RT-PCR validation
F:
TTGTGCATGTACCTGTTTGAACAC
R:
CAGAAACATGATTTGGTTTATAGTGC
Band lengths:
214-858
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]