GgaINT0072511 @ galGal3
Intron Retention
Gene
ENSGALG00000014372 | Q6TQF9_CHICK
Description
NA
Coordinates
chr4:75891306-75892213:-
Coord C1 exon
chr4:75892018-75892213
Coord A exon
chr4:75891402-75892017
Coord C2 exon
chr4:75891306-75891401
Length
616 bp
Sequences
Splice sites
5' ss Seq
GAGGTAAGC
5' ss Score
9.85
3' ss Seq
TTGTTTTTCTTTTCTTAAAGCTT
3' ss Score
9.22
Exon sequences
Seq C1 exon
GGCCTTTGCTGGGGCAACAATCCATGATTTCTTTAACTGGCTTGCTGTGTTTGCATTGTTGCCCATTGAAGTCATTTCTGGCTATCTTTACCATCTCACCAATGTTATAGTTGAGTCCTTTCATCTTGAAAGTGGTGAAGATGCCCCTGAGCTACTAAAAGTCATCACAGACCCTTTTACAAAGCTCATCATCGAG
Seq A exon
GTAAGCTCTTTAGCTCTTAAATTAAGTTGCTATACAGAGAGTCCTAGCTCCATACTTCCCATTTCTATTTCTTCCACATTTCACCTTAGTGAGGACAGACCTAGCTAGGAGGGCTGGGAAGGCAGGTGACACTTGGGATGGATGGAGTGTCAGACTATTGCATAGACACTGGCAGACAGTACTACTTGAGGCAACCTAATACATCCAGAAGATCTGCATAAGACTTGAAGAAATAACGTAAATTATGGGAAACTTACACACCACTGGAGGAGCAGCTGGAGGCCAGATGAATAGCGTGCAGATCCTAAAATGTCAGTAAACATGTTTAAGCAGTTACGTCAGCATAGCTGCTTGAATAAAATGGCTGAGATACATGTGTGGGTGATTTGGGGAGAATGAGACACAGCATGTGTGTGTGTGTGTGTGTGTGTGTAGAATTTAACCTTCTCTGGGAGTAAAGCCCCTCCTCCCTGTTGGGCAGCAGCTCCAGTGTTAGGGATGGTCATGAAAGCTTTACGTGGTTCAGTTTCCAAAAGAAAGTCGTCATGTGAGTTGAGCTGAACAAAAGTGTGTGATGCAAGTTGAAATAATGCTGTTTGTTTTTCTTTTCTTAAAG
Seq C2 exon
CTTGATAAATCTGTAATAAATGCAATCGCTACTAATGACGAATCAGCAAAAAACAAAAGCCTGGTAAAGGTTTGGTGCATAACTGAAACCAATGTG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000014372:ENSGALT00000023222:7
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
PF0269010=Na_Pi_cotrans=PD(26.4=56.1)
A:
NA
C2:
NO
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
TGCTGGGGCAACAATCCATG
R:
CACATTGGTTTCAGTTATGCACCA
Band lengths:
286-902
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]