RnoINT0030486 @ rn6
Intron Retention
Gene
ENSRNOG00000012932 | Ccdc146
Description
coiled-coil domain containing 146 [Source:MGI Symbol;Acc:MGI:1922422]
Coordinates
chr4:10410734-10411629:+
Coord C1 exon
chr4:10410734-10410862
Coord A exon
chr4:10410863-10411491
Coord C2 exon
chr4:10411492-10411629
Length
629 bp
Sequences
Splice sites
5' ss Seq
ATGGTAAAT
5' ss Score
6.41
3' ss Seq
GAAATTGTTTCCAACAATAGCTG
3' ss Score
3.33
Exon sequences
Seq C1 exon
TTTTCGCAGTGCGCAGATAGGATAAAAGCCCTGGAGAAATGTTTTGTGAACCCCGACTGCCAGGGCAGAGTCCGCTTCATTCCGGGGAAAGATCTGACCGAAGAAGAAATGATCAAGAAATTAGATATG
Seq A exon
GTAAATGCTCTTTCTTAAGCGCACAACTGTTTTCTCAGATACCACTGAAGCGGTTTTAGCCGCCAGCCTTCCCCTACTTGTAATAGAGTCCTAAATCCCAGCATTGATCCAGATATTTACCCAAAAAAGGAAAGATCCAGTAGTTTCTGGATTCAGAGGCACTCTTAAGAATTATGACTTTTCGGGGCTGGGGATTTAGCTCAGTGGTAGAGCGCTTACCTAGGAAGCGCAAGGCCCTGGGTTCGGTCCCCAGCTCCGAAAAAAAGAACCAAAAAAAAAAAAAAAAAAAAAAAGAATTATGACTTTTCGAATAAATATGTTAATTTGCCATCCTGGTGGGAACATCTGGGAAGAATGGCATTATGGGTACCAGATTGAGCCAGAGCCCTGGGAGGAGAGCCCCATCCCCTTACCCCAAATGTCCCTTGATATGGTGTAGCTCCAGAGACTTTTCAGAGGTGTTTTAACAACACAGAAAGCGGTGTGCCTCTGTCATGGGGTAGAGAACAGATGGAGGCAGGGGTAGCAGGAGGCAGGGAGGCAGGGGGGTGGGGAGGTACTGGGGGAATGAAGACCATTTCTTACATGTCATTTTTTTTAACTCCTATTGAAATTGTTTCCAACAATAG
Seq C2 exon
CTGGAACTTCAGCTAGCCAAGAAGGAAGAGAAGTTACTGGAGAAGGATTTCATCTATGAGCAGGTGTCCCAGCTCACAAACAGGCTCAAAACCAAAACTCAGGCTTGCAAGATGGACACACTGCTCTTAGCCAAGAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSRNOG00000012932:ENSRNOT00000017374:25
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):
C1:
NO
A:
NA
C2:
NO
Main Inclusion Isoform:
NA
Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
GCAGTGCGCAGATAGGATAAA
R:
GCTAAGAGCAGTGTGTCCATCT
Band lengths:
255-884
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]