GgaINT0126229 @ galGal4
Intron Retention
Gene
ENSGALG00000002364 | SEC16A
Description
SEC16 homolog A, endoplasmic reticulum export factor [Source:HGNC Symbol;Acc:HGNC:29006]
Coordinates
chr17:7858025-7858864:+
Coord C1 exon
chr17:7858025-7858169
Coord A exon
chr17:7858170-7858665
Coord C2 exon
chr17:7858666-7858864
Length
496 bp
Sequences
Splice sites
5' ss Seq
CAGGTCTGT
5' ss Score
6.84
3' ss Seq
TTGTTGGTTCGGTTCTTTAGACA
3' ss Score
5.76
Exon sequences
Seq C1 exon
CTTCCAAAGATCCAAGTCGTTGGGAACGTTACTCATCAGCTTATGACCCCAGATACAGAGATCCTAGAAGTTATGACCAGAGGTATATGTATGATGGTGAACACAACCCTTACCAGAAGAGAGAAGCATATCCATATGGCAACAG
Seq A exon
GTCTGTCTGTTCAATCTGTGTTCTCTTTGCTCTCTCCAGAACTAGGGCAGAGAAGGGCCTACGTGCTCATTATTTGGAGAGCTACTGTTCAGATGTGAATGCAGGCACATAGTGTAATATTATGCATCTCATAGTTATTCTTGTTAGTTCTTTTGCTTTAACATAAACAAAGTAGGAACAACAGATGAGCTGTTACATCAGCCTTGAGGATTTAAGGCAAAAAGGTTTGGTGGTTGTTTTTTTCAGATAAGATAAGCATTCTTTGTTTTCCTAGAACAGCCTTGAAACATGACATTGGTCTTGATTTTGAGTATTCTAGATGAAGTTCTTTAAGCCGTGTCAGTTTGTTTACTGTAATAAAAACCTAAATCTAGGAAGTAATCTAAAAGCCCTTCTGAAGTTAGGTAGAGTTTCCTTCTTGATAGGTATATAGTGGAGTCCCTTTCCTCTGGGCTATGGTTGGATATGTTTATTTTTTGTTGGTTCGGTTCTTTAG
Seq C2 exon
ACATGACCGATATGACGATCGTTGGAGGTACGATCCTCGCTTTACTGGAAGCTTTGATGATGATGCTGAGCCTCACAGAGATCCTTATGGAGATGAGTTTGATAGGCGCAGTGTTCACAGTGAGCATTCTGGGCACAGCCTCCGGAGCTCCCACAGTGTGCACAGTCACCGGAGCAGCTTCAGCTCTCGTTCCCAACAA
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000002364:ENSGALT00000003726:7
Average complexity
IR
Mappability confidence:
NA
Protein Impact
ORF disruption upon sequence inclusion
No structure available
Features
Disorder rate (Iupred):
C1=0.673 A=NA C2=0.776
Domain overlap (PFAM):
C1:
NO
A:
NA
C2:
NO
Main Inclusion Isoform:
NA

Other Inclusion Isoforms:
NA
Other Skipping Isoforms:
NA
Associated events
Other assemblies
Conservation
Fruitfly
(dm6)
No conservation detected
Primers PCR
Suggestions for RT-PCR validation
F:
CTTCCAAAGATCCAAGTCGTTG
R:
GTTGGGAACGAGAGCTGAAGC
Band lengths:
342-838
Functional annotations
There are 0 annotated functions for this event
GENOMIC CONTEXT[edit]
INCLUSION PATTERN[edit]