Special

DreINT0047218 @ danRer10

Intron Retention

Gene
Description
cytoplasmic linker associated protein 2 [Source:ZFIN;Acc:ZDB-GENE-040426-2343]
Coordinates
chr19:43205303-43206123:+
Coord C1 exon
chr19:43205303-43205366
Coord A exon
chr19:43205367-43206066
Coord C2 exon
chr19:43206067-43206123
Length
700 bp
Sequences
Splice sites
5' ss Seq
AAGGTACCC
5' ss Score
9.16
3' ss Seq
CCCCTGTTTCTGATTTGCAGCGT
3' ss Score
10.03
Exon sequences
Seq C1 exon
TCGTGTTGAGCTGAAGAGGCTGTGTGAAATCTTCACCAGGATGTTTGCAGACCCACACAGCAAG
Seq A exon
GTACCCTCGCATGCCGCTTTCAGACACGCTGCAGAACAAACACACACACTTCTGCAGACATAACCCCGCATGATCTTCATGCATCACACAAAACCGCTTGACTGTATCGGATTCTGCCTCACCCACAGCCCGTGTTCTGGCCACAGACACACAGATCAACACTCTCAGGCATGTGCAGTGCACACTAACTCTCGGGTTAAAGACCATGGCTAATCGCATGGTTTGGTTTTGAGTGGATTTCTGATTTCAGGCTCGTTCGCTCGTCTTTTTTCCAACCATTGCAGCGCCGACTAAAACGTTTCTGGCATAGCTTTTCTCTCTTTCCTGCTTGCACTCACCTCACTCATATGCTGGGACTGTCACAAATCCTAAAATATAATAAATAGACAAACAGCTTAAAATTAGATCTGCATGATATTGGAAAAATGCTTACTTTGAGACGCCTCAAAAATAGGTTAGTTTGGGCTAGGATAAGTACATTAATTTATATAGCTCTGATTGAACTGACAGCCCAGTCCTACACACACACACACACACACTAACCTGCGGTTGAGGTGACTCTTTCTCTCTCTCACTCTCCACTCATTCCGTTTTTCTGGAAACTCCTGGCATTCTCCTTTTTTTTTGTCGGGTAGGCCGTAGCCCCGCCCCTTATGTCTGATTGGTGGGCTCATGACCCGCCCCTGTTTCTGATTTGCAG
Seq C2 exon
CGTGATCCCAGAGGCTTCGGCACGGTAGAATCCGGTATCAGTTCTGCCTCGTTTAAG
VastDB Features
Vast-tools module Information
Secondary ID
ENSDARG00000020345:ENSDART00000144557:22
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (disopred):
  C1=0.068 A=NA C2=0.895
Domain overlap (PFAM):

C1:
PF123483=CLASP_N=FE(9.2=100),PF046827=Herpes_BTRF1=FE(23.1=100)
A:
NA
C2:
NO


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
Associated events
Primers PCR
Suggestions for RT-PCR validation
F:
No suggested primer sequences
R:
No suggested primer sequences
Band lengths:
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]