Special

GgaINT0000901 @ galGal3

Intron Retention

Gene
Description
NA
Coordinates
chrE22C19W28_E50C23:52737-53658:-
Coord C1 exon
chrE22C19W28_E50C23:53554-53658
Coord A exon
chrE22C19W28_E50C23:53008-53553
Coord C2 exon
chrE22C19W28_E50C23:52737-53007
Length
546 bp
Sequences
Splice sites
5' ss Seq
CTGGTGAGT
5' ss Score
10.1
3' ss Seq
GCCTCTCTCCTGTTGCACAGAAC
3' ss Score
7.35
Exon sequences
Seq C1 exon
TTTGGAGGTCAAGATATTTTCATGACAGAAGAACAAAAGAAATACTACAATGCCATGAAAAAACTGGGCTCCAAGAAGCCTCAAAAGCCAATTCCCCGGCCTCTG
Seq A exon
GTGAGTATGTTAGAAAGGGAAAAAAATGCAGAACAGACTTCTGAAGGAGCTTCAGCTCCAAAAGCATCCTTTGTTCTAACTCATGCTGGACAGCACATCATCATCTTGTCTCCTCCCCTTAGAGTAGGGTCTTGGGCCATATGGTTACACCAGTCAGAACCTAGGCACGTTTCCCTGCTTTGTGAAAGGCTTTGCATGGTGAGTTCTGTAGGTAATGCCATGGGTAAGTCATCCTGAGGTCACTGCTGCAGGGCAGACCTGGCTGCTTCCTCCAGCTGTGAATGGAATAGTCAGCCTGCGTTTGCTCCCACCGAAGAGCGAGACATGCTGGTAATAGGGCTGCTCATCTGGGATATAAATAATAGCATCTTCCTACCTTTCCCCCACACAGATTGATCTGTGGCTAGAGTGTGCCTTGAAAGCTTCAAAGGGTACCGAGAAGCAATGTCCTCATCCCTGTTTCTACCAACAGGAAAGCAATCTGTTGACTGATGGCAGATTTTTGTTCCAACCTGTTTGGCTCACGGCCTCTCTCCTGTTGCACAG
Seq C2 exon
AACCGCATTCAGGGAGCTGTCTTTGACTTTGTCACTCAGCAAGCATTCGACATCGTCATCATGATGCTCATCTGCCTCAACATGGTGACCATGATGGTGGAGACGGACACACAGAGCAAGCAGATGGAGGACATCCTCTACTGGATCAACCTGGTGTTCGTCATCTTCTTCACCTGCGAGTGTGTGCTGAAGATGTTCGCCTTGCGGCACTACTACTTCACCATTGGGTGGAACATCTTTGACTTCGTTGTTGTGATTCTGTCCATTGTGG
VastDB Features
Vast-tools module Information
Secondary ID
ENSGALG00000006060:ENSGALT00000009776:25
Average complexity
IR
Mappability confidence:
NA
Protein Impact

ORF disruption upon sequence inclusion

No structure available
Features
Disorder rate (Iupred):
  C1=0.000 A=NA C2=0.000
Domain overlap (PFAM):

C1:
NO
A:
NA
C2:
PF0052026=Ion_trans=PU(20.5=47.3)


Main Inclusion Isoform:
NA


Main Skipping Isoform:


Other Inclusion Isoforms:
NA


Other Skipping Isoforms:
Associated events
Primers PCR
Suggestions for RT-PCR validation
F:
ACAAAAGAAATACTACAATGCCATGA
R:
CCACAATGGACAGAATCACAACA
Band lengths:
344-890
Functional annotations
There are 0 annotated functions for this event


GENOMIC CONTEXT[edit]

INCLUSION PATTERN[edit]